What happens when reliability can no longer be guaranteed by simply following the rules?

What you’ll learn...

(01:08) Andras's path from Flomerics and MicReD to Siemens EDA

(01:52) Why 3D IC reliability breaks from traditional 2D design

(05:04) The physics of CTE mismatch: warpage, cracking, delamination

(08:55) How performance-driven choices create a thermal time bomb

(11:31) Why failures happen at interfaces: solder, hybrid bonding, TIMs

(17:51) The human side: breaking silos between thermal, electrical, mechanical teams

(21:53) Siemens' digital continuity vision via Innovator3D IC Integrator

(22:11) The path to automation: agentic AI, natural-language tools

(26:43) Andras's key message: don't treat reliability as an afterthought

More about this episode…

In this episode of the Siemens 3D IC Podcast, host Tova Levy speaks with Andras Vass-Varnai, Solution Architect for 3D IC reliability at Siemens EDA, about why reliability can no longer be guaranteed simply by following design rules — and what it takes to build it in from day one.

Andras explains why 3D IC breaks the old reliability playbook: in 2D packaging, reliability is largely baked into process rules, but the sheer number of design choices in 3D IC — stacking, floor planning, materials, cooling — means reliability has to be checked continuously, not verified at the end. He walks through the physics behind this: CTE mismatch between stacked materials causes warpage that accumulates with thermal cycling, ultimately leading to cracking or delamination — and breaks down where failures actually happen, with solder interconnects as the likely weak link, hybrid bonding as a manufacturing-sensitive but operationally strong alternative, and thermal interface materials as a make-or-break factor.

The conversation also covers the organizational side — how breakdowns in communication between thermal, electrical, and mechanical teams become reliability risks of their own — and Siemens' approach to closing that gap through digital continuity, using Innovator3D IC Integrator to connect design disciplines, with a look ahead to how agentic AI could eventually automate the process. Andras closes with a clear message: break down the silos, and treat reliability as continuous from the start — not a final checkbox.

Ideal for: 3D IC and package architects, thermal and reliability engineers, signal/power integrity engineers, EDA tool users, and anyone working across the electrical-thermal-mechanical boundary in advanced packaging.

Connect with Tova Levy

Website

Connect with Andras Vass-Varnai

Siemens EDA